A testing methodology for commercial automated test equipment (ATE) conventionally used for electrical integrated circuits is developed for photonic integrated circuits. The method is assessing by efficiently characterizing a packaged low-port optical switch matrix.
Automated characterization of SiP MZI-based switches
GAMBINI, Fabrizio;FARALLI, STEFANO;
2015-01-01
Abstract
A testing methodology for commercial automated test equipment (ATE) conventionally used for electrical integrated circuits is developed for photonic integrated circuits. The method is assessing by efficiently characterizing a packaged low-port optical switch matrix.File in questo prodotto:
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